Zeiss Auriga SEM

Contact: Emma Bullock or Suzy Vitale
Location: A-G26

Our Zeiss Auriga field emission SEM was installed in 2009.  It is equipped with in-chamber secondary electron (SE) and backscattered electron (BSE) detectors, a retractable concentric BSE detector, and a retractable STEM detector for imaging electron transparent materials.  In addition, it is equipped with an Oxford Instruments X-Max 80 (SDD) EDS system.  Other features include local charge compensation (for non-conductive samples), large area mapping/imaging software, an Omniprobe micromanipulator, and an Evactron plasma cleaner.